On April 14, 2015, the third OCTUM Technology & User Day in the Audi Forum Neckarsulm with 70 participants continues the tradition of this event series. This year, Track & Trace both in pharmaceuticals and in the automotive sector was one of focal points of the user presentations in usual pleasant atmosphere.
In the opening lecture, Mr. Gruenendick from ThyssenKrupp Steel Europe impressively presented the Quality Tracking Information System for Coils of the steel manufacturers ArcelorMittal, Tata and Thyssen with the barcode reading system from OCTUM as a key component. Mr. Koehler from Schuler Automation described the possibilities for using this quality information in the next coil and board production processes in his subsequent presentation. Schuler also presented the optical centering systems of the board and stack inspections by OCTUM as well as further inspections as an integral part of flexible, automated coil and board processing lines. Mr. Kneusels from Antares Vision showed practice-proven solutions for serialization and track & trace in the pharmaceutical industry in the global environment. In the much appraised presentation, both the presenter and the company, with their wealth of experience in the implementation of complex pharmaceutical projects, scored high marks with the audience. Labeling of single pharmaceutical packings as a prerequisite for serialization and track & trace were the subject of the presentation given by Mr. Reuss from Domino. The basic legal conditions were highlighted in addition to the labeling technologies.
In the technological part of the presentations, Mr. Biedenkap presented the innovations of Opto Engineering in the field of optics and lighting systems as well as special optics. The special technological features for µm accurate measurement and application examples for µm accurate 2D & 3D measurement were the subject of Mr. Horvath's OCTUM presentation. Mr. Koch from OCTUM presented technological tricks for pharmaceutical high-speed quality inspections as well as experiences in the field of infrared inspection.